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Applicability of Polyimide Films as Etched-Track Detectors for Ultra-Heavy Cosmic Ray Components

Tomoya Yamauchi1, Kenya Matsukawa1, Yutaka Mori1, Masato Kanasaki1, Atsuto Hattori1, Yuri Matai1, Tamon Kusumoto1, Akira Tao1, Keiji Oda1, Satoshi Kodaira2, Teruaki Konishi2, Hisashi Kitamura2, Nakahiro Yasuda3, and Rémi Barillon4

1Graduate School of Maritime Sciences, Kobe University, Kobe 658-0022, Japan
2National Institute of Radiological Sciences, Chiba 263-8555, Japan
3Research Institute of Nuclear Engineering, Fukui University, Tsuruga, Fukui 914-0055, Japan
4Institute Pluridisiplinaire Hubert Curien (UMR7178), Strasbourg Cedex 2, France

(Received February 13, 2013; accepted March 15, 2013; published online April 3, 2013)

The track registration property in polyimide Kapton has been examined for heavy ions, including 2.3 GeV Fe and 24 GeV Xe ions. Conventional track formation criteria fail to predict the thresholds of etch pit formation, while a chemical criterion stating that etchable tracks are formed when two adjacent diphenyl ethers are broken in the vicinity of the ion's trajectory should be more appropriate. Discriminative detections of ultra-heavy components in cosmic rays, such as Bi, Th, and U ions, are possible by measuring the recorded track length. ©2013 The Japan Society of Applied Physics

URL: http://apex.jsap.jp/link?APEX/6/046401/
DOI: 10.7567/APEX.6.046401
PACS: 29.40.Gx,96.50.S-,61.82.Pv


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